Magnetic and magnetoelastic properties of amorphous Fe-Si-B-C films
We present magnetic and magnetoelastic data measured from a wide range of amorphous films grown by RF sputter deposition. The films were deposited in HV conditions at sputtering pressures of 5 to 80 mTorr and power densities of 1.6 and 3.2 W/cm/sup 2/. Compositions were measured by electron probe mi...
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Veröffentlicht in: | IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) 1994-11, Vol.30 (6), p.4806-4808 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | We present magnetic and magnetoelastic data measured from a wide range of amorphous films grown by RF sputter deposition. The films were deposited in HV conditions at sputtering pressures of 5 to 80 mTorr and power densities of 1.6 and 3.2 W/cm/sup 2/. Compositions were measured by electron probe micro-analysis (EPMA) and found to be similar to the target material at pressures of 20 mTorr. This pressure also gave the minimum coercivity and minimum stress corresponding to a transition from compressive to tensile stress. All films exhibited in-plane anisotropy, the origin of which is the stray induction from the target magnetron magnets.< > |
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ISSN: | 0018-9464 1941-0069 |
DOI: | 10.1109/20.334228 |