Magnetic and magnetoelastic properties of amorphous Fe-Si-B-C films

We present magnetic and magnetoelastic data measured from a wide range of amorphous films grown by RF sputter deposition. The films were deposited in HV conditions at sputtering pressures of 5 to 80 mTorr and power densities of 1.6 and 3.2 W/cm/sup 2/. Compositions were measured by electron probe mi...

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Veröffentlicht in:IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) 1994-11, Vol.30 (6), p.4806-4808
Hauptverfasser: Mattingley, A.D., Shearwood, C., Gibbs, M.R.J.
Format: Artikel
Sprache:eng
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Zusammenfassung:We present magnetic and magnetoelastic data measured from a wide range of amorphous films grown by RF sputter deposition. The films were deposited in HV conditions at sputtering pressures of 5 to 80 mTorr and power densities of 1.6 and 3.2 W/cm/sup 2/. Compositions were measured by electron probe micro-analysis (EPMA) and found to be similar to the target material at pressures of 20 mTorr. This pressure also gave the minimum coercivity and minimum stress corresponding to a transition from compressive to tensile stress. All films exhibited in-plane anisotropy, the origin of which is the stray induction from the target magnetron magnets.< >
ISSN:0018-9464
1941-0069
DOI:10.1109/20.334228