High quality Nb-AlO/sub x/-Nb junctions for microwave receivers and SFQ logic device

High quality Nb-AlO/sub x/-Nb junctions for microwave receivers and SFQ logic device

The specific capacitance of high-quality (V/sub m/>50 mV) Nb-AlO/sub x/-Nb tunnel junctions is determined by the following methods: the measurement of zero field step resonances in specially prepared long Josephson junctions, and the definition of the resonant voltages in two-junction interferome...

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Veröffentlicht in:IEEE transactions on magnetics 1991-03, Vol.27 (2), p.3141-3144
Hauptverfasser: Koshelets, V.P., Kovtonyuk, S.A., Serpuchenko, I.L., Filippenko, L.V., Shchukin, A.V.
Format: Artikel
Sprache:eng
Schlagworte:
Capacitance measurement
Circuits
Critical current density
Current measurement
Fabrication
Josephson junctions
Logic devices
Microwave devices
Resonance
SQUIDs
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Beschreibung
Zusammenfassung:The specific capacitance of high-quality (V/sub m/>50 mV) Nb-AlO/sub x/-Nb tunnel junctions is determined by the following methods: the measurement of zero field step resonances in specially prepared long Josephson junctions, and the definition of the resonant voltages in two-junction interferometers based on Nb-AlO/sub x/-Nb junctions. The results obtained by these methods were compared with each other and with the figures calculated from the measurements of tunnel barrier parameters. The application of the procedure for the fabrication of single flux quantum (SFQ) logic devices is discussed.
ISSN:0018-9464
1941-0069
DOI:10.1109/20.133877