Design of test sequences for VLSI self-testing using LFSR

Consider a shift register (SR) of length n and a collection of designated subsets of (0,1, . . ., n-1). The problem is how to add feedback to the SR such that the resulting linear feedback shift register (LFSR) exercises (almost) exhaustively each of the designated subsets and is of small period. Se...

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Veröffentlicht in:	IEEE transactions on information theory 1990-03, Vol.36 (2), p.386-392
1. Verfasser:	Hollmann, H.
Format:	Artikel
Sprache:	eng
Schlagworte:	Applied sciences Automatic testing Built-in self-test Character generation Costs Design methodology Electric, optical and optoelectronic circuits Electronics Exact sciences and technology Linear feedback shift registers Polynomials Shift registers Strontium Very large scale integration
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