Design of test sequences for VLSI self-testing using LFSR

Design of test sequences for VLSI self-testing using LFSR

Consider a shift register (SR) of length n and a collection of designated subsets of (0,1, . . ., n-1). The problem is how to add feedback to the SR such that the resulting linear feedback shift register (LFSR) exercises (almost) exhaustively each of the designated subsets and is of small period. Se...

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Veröffentlicht in:IEEE transactions on information theory 1990-03, Vol.36 (2), p.386-392
1. Verfasser: Hollmann, H.
Format: Artikel
Sprache:eng
Schlagworte:
Applied sciences
Automatic testing
Built-in self-test
Character generation
Costs
Design methodology
Electric, optical and optoelectronic circuits
Electronics
Exact sciences and technology
Linear feedback shift registers
Polynomials
Shift registers
Strontium
Very large scale integration
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Zusammenfassung:Consider a shift register (SR) of length n and a collection of designated subsets of (0,1, . . ., n-1). The problem is how to add feedback to the SR such that the resulting linear feedback shift register (LFSR) exercises (almost) exhaustively each of the designated subsets and is of small period. Several previously known results for maximum-length LFSR are extended to more general LFSR, and in particular a previously known algorithm is simplified and extended. Applications to the problems of VLSI self-testing are discussed and illustrated.< >
ISSN:0018-9448
1557-9654
DOI:10.1109/18.52485