An X-band GaN HEMT power amplifier design using an artificial neural network modeling technique

In this paper, the first gallium nitride (GaN) based high electron mobility transistor (HEMT) power amplifier design using an artificial neural network (ANN) modeling technique is presented. The ANN technique was used to model the small signal behavior of a device with a gate periphery of 1 mm and a...

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Veröffentlicht in:IEEE transactions on electron devices 2001-03, Vol.48 (3), p.495-501
Hauptverfasser: Sang Yun Lee, Cetiner, B.A., Torpi, H., Cai, S.J., Jiang Li, Alt, K., Chen, Y.L., Wen, C.P., Wang, K.L., Itoh, T.
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Sprache:eng
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Zusammenfassung:In this paper, the first gallium nitride (GaN) based high electron mobility transistor (HEMT) power amplifier design using an artificial neural network (ANN) modeling technique is presented. The ANN technique was used to model the small signal behavior of a device with a gate periphery of 1 mm and a gate length of 1 /spl mu/m over the broad frequency range from 1 GHz to 26 GHz with multiple bias points, based on fitting calculated S-parameters to measured S-parameters. A single stage amplifier constructed using these parameters showed a gain of about 7 dB and an output power of 1.2 W at 8 GHz when biased at V/sub ds/ = 20 V and I/sub ds/ 220 mA in class AB mode. The good agreement between measured and simulated results was shown in both S-parameter modeling and in amplifier design.
ISSN:0018-9383
1557-9646
DOI:10.1109/16.906442