A lateral magnetotransistor structure with a linear response to the magnetic field

An experimental study and analytical model of a novel magnetotransistor are presented. This device displays some very promising features. A linear response to the magnetic field is experimentally demonstrated and very high sensitivities are measured, on the order of 3000%/T. Previous comparable magn...

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Veröffentlicht in:IEEE transactions on electron devices 1989-06, Vol.36 (6), p.1076-1086
Hauptverfasser: Ristic, L., Smy, T., Baltes, H.P.
Format: Artikel
Sprache:eng
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Beschreibung
Zusammenfassung:An experimental study and analytical model of a novel magnetotransistor are presented. This device displays some very promising features. A linear response to the magnetic field is experimentally demonstrated and very high sensitivities are measured, on the order of 3000%/T. Previous comparable magnetotransistors have reported sensitivities on the order of 150%/T. A theoretical explanation of the very high sensitivity is proposed, involving carrier deflection as the dominant operating principle.< >
ISSN:0018-9383
1557-9646
DOI:10.1109/16.24351