Characterization of PCB plated-through-hole reliability using statistical analysis
Various test methods are used to characterize PCB plated-through-hole reliability. One such method is the interconnect stress test. The results from this test are often used to qualify PCB materials and or fabricators. This paper will discuss how certain statistical analysis techniques may be used t...
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Veröffentlicht in: | Circuit world 2005-03, Vol.31 (1), p.8-15 |
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description | Various test methods are used to characterize PCB plated-through-hole reliability. One such method is the interconnect stress test. The results from this test are often used to qualify PCB materials and or fabricators. This paper will discuss how certain statistical analysis techniques may be used to decipher the results, and predict capabilities of PCB materials and or processes. |
doi_str_mv | 10.1108/03056120510553176 |
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title | Characterization of PCB plated-through-hole reliability using statistical analysis |
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