$The Ab Initio Solution of Structures from Powder Diffraction Data: the Use of Maximum Entropy and Likelihood to Determine the Relative Amplitudes of Overlapped Reflections Using the Pseudophase Concept$

The Ab Initio Solution of Structures from Powder Diffraction Data: the Use of Maximum Entropy and Likelihood to Determine the Relative Amplitudes of Overlapped Reflections Using the Pseudophase Concept

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Veröffentlicht in:	Acta crystallographica. Section A, Foundations of crystallography Foundations of crystallography, 1998-07, Vol.54 (4), p.438-446
Hauptverfasser:	Dong, W., Gilmore, C. J.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Single-crystal and powder diffraction Structure of solids and liquids crystallography X-ray diffraction and scattering
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ISSN:	0108-7673 1600-5724
DOI:	10.1107/S0108767398000063