$On the minimum number of beams needed to distinguish enantiomorphs in X-ray and electron diffraction$

On the minimum number of beams needed to distinguish enantiomorphs in X-ray and electron diffraction

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Bibliographische Detailangaben
Veröffentlicht in:	Acta crystallographica. Section A, Foundations of crystallography Foundations of crystallography, 1994-09, Vol.50 (5), p.647-650
Hauptverfasser:	Spence, J. C. H., Zuo, J. M., O'Keeffe, M., Marthinsen, K., Hoier, R.
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Electron diffraction and scattering Exact sciences and technology Physics Single-crystal and powder diffraction Structure of solids and liquids crystallography X-ray diffraction and scattering
Online-Zugang:	Volltext
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