Two-Dimensional Desmearing of Centrosymmetric Small-Angle X-ray Scattering Diffraction Patterns

Owing to the high dynamic range and resolution of image plates, digitization of the direct‐beam profile as well as of two‐dimensional small‐angle X‐ray scattering patterns gives data with enough accuracy to allow desmearing of two‐dimensional patterns after corrections of geometrical distortions. A...

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Veröffentlicht in:Journal of applied crystallography 1996-04, Vol.29 (2), p.110-117
Hauptverfasser: Le Flanchec, V., Gazeau, D., Taboury, J., Zemb, Th
Format: Artikel
Sprache:eng
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Zusammenfassung:Owing to the high dynamic range and resolution of image plates, digitization of the direct‐beam profile as well as of two‐dimensional small‐angle X‐ray scattering patterns gives data with enough accuracy to allow desmearing of two‐dimensional patterns after corrections of geometrical distortions. A radial conversion of the images is used to compress the images and to isolate a small area of interest. The results obtained by the Wiener filtering method and the iterative method of Van Cittert on simulated patterns are compared.
ISSN:1600-5767
0021-8898
1600-5767
DOI:10.1107/S0021889895008144