Separation of the particle size and microstrain components in the Fourier coefficients of a single diffraction profile
The particle size and the microstrain components in the Fourier coefficients of a single diffraction profile can be separated, if the functional form of the dependence of the average microstrain on the averaging distance is known. It is shown that if this functional form is approximated as 〈ɛn2〉 = C...
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Veröffentlicht in: | Journal of applied crystallography 1974-08, Vol.7 (4), p.434-439 |
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Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | The particle size and the microstrain components in the Fourier coefficients of a single diffraction profile can be separated, if the functional form of the dependence of the average microstrain on the averaging distance is known. It is shown that if this functional form is approximated as 〈ɛn2〉 = C/n, where C is a constant, acceptable separation of the two components can be obtained. In the presence of mean residual strains or peak‐shifts due to faulting, the alternative approximation 〈ɛn2〉 = C1 + C2/n may be used. |
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ISSN: | 1600-5767 0021-8898 1600-5767 |
DOI: | 10.1107/S0021889874010089 |