Anomalous X-Ray Yields under Surface Wave Resonance during Reflection High Energy Electron Diffraction and Adatom Site Determination
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| Veröffentlicht in: | Physical review letters 2000-05, Vol.84 (19), p.4389-4392 |
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| Sprache: | eng |
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| container_end_page | 4392 |
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| container_issue | 19 |
| container_start_page | 4389 |
| container_title | Physical review letters |
| container_volume | 84 |
| creator | Yamanaka, Toshiro Ino, Shozo |
| description | |
| doi_str_mv | 10.1103/PhysRevLett.84.4389 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0031-9007 |
| ispartof | Physical review letters, 2000-05, Vol.84 (19), p.4389-4392 |
| issn | 0031-9007 1079-7114 |
| language | eng |
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| source | American Physical Society Journals |
| title | Anomalous X-Ray Yields under Surface Wave Resonance during Reflection High Energy Electron Diffraction and Adatom Site Determination |
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