Dissociative Chemisorption of O 2 Inducing Stress Corrosion Cracking in Silicon Crystals
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Veröffentlicht in: | Physical review letters 2014-03, Vol.112 (11), Article 115501 |
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container_title | Physical review letters |
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creator | Gleizer, Anna Peralta, Giovanni Kermode, James R. De Vita, Alessandro Sherman, Dov |
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doi_str_mv | 10.1103/PhysRevLett.112.115501 |
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fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1103_PhysRevLett_112_115501</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1103_PhysRevLett_112_115501</sourcerecordid><originalsourceid>FETCH-LOGICAL-c185t-35d380f00f13aad10b3a7613896337d109c728e606c2747d51604162161426bf3</originalsourceid><addsrcrecordid>eNpNkG9LwzAQh4MoWKdfQfIFqndJm7Qvpf4bFCZOwXclSxMX3dqRxEG__VrnC18cP-654zgeQq4RbhCB376sh_Bq9rWJcQRsrDwHPCEJgixTiZidkgSAY1oCyHNyEcIXACATRUI-7l0IvXYqur2h1dpsXej9Lrq-o72lC8rovGt_tOs-6TJ6EwKteu_7MC1UXunvaeI6unQbp3_ZEKLahEtyZscwV385I--PD2_Vc1ovnubVXZ1qLPKY8rzlBVgAi1ypFmHFlRTIi1JwLse-1JIVRoDQTGayzVFAhoKhwIyJleUzIo539fhU8MY2O--2yg8NQjP5af75GQFrjn74ATPpW24</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Dissociative Chemisorption of O 2 Inducing Stress Corrosion Cracking in Silicon Crystals</title><source>American Physical Society Journals</source><creator>Gleizer, Anna ; Peralta, Giovanni ; Kermode, James R. ; De Vita, Alessandro ; Sherman, Dov</creator><creatorcontrib>Gleizer, Anna ; Peralta, Giovanni ; Kermode, James R. ; De Vita, Alessandro ; Sherman, Dov</creatorcontrib><identifier>ISSN: 0031-9007</identifier><identifier>EISSN: 1079-7114</identifier><identifier>DOI: 10.1103/PhysRevLett.112.115501</identifier><language>eng</language><ispartof>Physical review letters, 2014-03, Vol.112 (11), Article 115501</ispartof><lds50>peer_reviewed</lds50><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c185t-35d380f00f13aad10b3a7613896337d109c728e606c2747d51604162161426bf3</citedby><cites>FETCH-LOGICAL-c185t-35d380f00f13aad10b3a7613896337d109c728e606c2747d51604162161426bf3</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,776,780,2863,2864,27901,27902</link.rule.ids></links><search><creatorcontrib>Gleizer, Anna</creatorcontrib><creatorcontrib>Peralta, Giovanni</creatorcontrib><creatorcontrib>Kermode, James R.</creatorcontrib><creatorcontrib>De Vita, Alessandro</creatorcontrib><creatorcontrib>Sherman, Dov</creatorcontrib><title>Dissociative Chemisorption of O 2 Inducing Stress Corrosion Cracking in Silicon Crystals</title><title>Physical review letters</title><issn>0031-9007</issn><issn>1079-7114</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2014</creationdate><recordtype>article</recordtype><recordid>eNpNkG9LwzAQh4MoWKdfQfIFqndJm7Qvpf4bFCZOwXclSxMX3dqRxEG__VrnC18cP-654zgeQq4RbhCB376sh_Bq9rWJcQRsrDwHPCEJgixTiZidkgSAY1oCyHNyEcIXACATRUI-7l0IvXYqur2h1dpsXej9Lrq-o72lC8rovGt_tOs-6TJ6EwKteu_7MC1UXunvaeI6unQbp3_ZEKLahEtyZscwV385I--PD2_Vc1ovnubVXZ1qLPKY8rzlBVgAi1ypFmHFlRTIi1JwLse-1JIVRoDQTGayzVFAhoKhwIyJleUzIo539fhU8MY2O--2yg8NQjP5af75GQFrjn74ATPpW24</recordid><startdate>20140318</startdate><enddate>20140318</enddate><creator>Gleizer, Anna</creator><creator>Peralta, Giovanni</creator><creator>Kermode, James R.</creator><creator>De Vita, Alessandro</creator><creator>Sherman, Dov</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20140318</creationdate><title>Dissociative Chemisorption of O 2 Inducing Stress Corrosion Cracking in Silicon Crystals</title><author>Gleizer, Anna ; Peralta, Giovanni ; Kermode, James R. ; De Vita, Alessandro ; Sherman, Dov</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c185t-35d380f00f13aad10b3a7613896337d109c728e606c2747d51604162161426bf3</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2014</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Gleizer, Anna</creatorcontrib><creatorcontrib>Peralta, Giovanni</creatorcontrib><creatorcontrib>Kermode, James R.</creatorcontrib><creatorcontrib>De Vita, Alessandro</creatorcontrib><creatorcontrib>Sherman, Dov</creatorcontrib><collection>CrossRef</collection><jtitle>Physical review letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Gleizer, Anna</au><au>Peralta, Giovanni</au><au>Kermode, James R.</au><au>De Vita, Alessandro</au><au>Sherman, Dov</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Dissociative Chemisorption of O 2 Inducing Stress Corrosion Cracking in Silicon Crystals</atitle><jtitle>Physical review letters</jtitle><date>2014-03-18</date><risdate>2014</risdate><volume>112</volume><issue>11</issue><artnum>115501</artnum><issn>0031-9007</issn><eissn>1079-7114</eissn><doi>10.1103/PhysRevLett.112.115501</doi><oa>free_for_read</oa></addata></record> |
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title | Dissociative Chemisorption of O 2 Inducing Stress Corrosion Cracking in Silicon Crystals |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T22%3A42%3A53IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Dissociative%20Chemisorption%20of%20O%202%20Inducing%20Stress%20Corrosion%20Cracking%20in%20Silicon%20Crystals&rft.jtitle=Physical%20review%20letters&rft.au=Gleizer,%20Anna&rft.date=2014-03-18&rft.volume=112&rft.issue=11&rft.artnum=115501&rft.issn=0031-9007&rft.eissn=1079-7114&rft_id=info:doi/10.1103/PhysRevLett.112.115501&rft_dat=%3Ccrossref%3E10_1103_PhysRevLett_112_115501%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |