Modeling the compositional dependence of electron diffraction in dilute GaAs- and GaP-based compound semiconductors
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| Veröffentlicht in: | Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2008-08, Vol.78 (7), Article 075207 |
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| container_issue | 7 |
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| container_title | Physical review. B, Condensed matter and materials physics |
| container_volume | 78 |
| creator | Rubel, O. Németh, I. Stolz, W. Volz, K. |
| description | |
| doi_str_mv | 10.1103/PhysRevB.78.075207 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 1098-0121 |
| ispartof | Physical review. B, Condensed matter and materials physics, 2008-08, Vol.78 (7), Article 075207 |
| issn | 1098-0121 1550-235X |
| language | eng |
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| source | American Physical Society Journals |
| title | Modeling the compositional dependence of electron diffraction in dilute GaAs- and GaP-based compound semiconductors |
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