Quantitative analysis of Si mass transport during formation of Cu ∕ Si ( 111 ) − ( 5 × 5 ) from scanning tunneling microscopy

Quantitative analysis of Si mass transport during formation of Cu ∕ Si ( 111 ) − ( 5 × 5 ) from scanning tunneling microscopy

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Veröffentlicht in:Physical review. B, Condensed matter and materials physics Condensed matter and materials physics, 2007-02, Vol.75 (7), Article 073407
Hauptverfasser: Zhang, Y. P., Yong, K. S., Chan, H. S. O., Xu, G. Q., Chen, S., Wang, X. S., Wee, A. T. S.
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container_issue 7
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container_title Physical review. B, Condensed matter and materials physics
container_volume 75
creator Zhang, Y. P.
Yong, K. S.
Chan, H. S. O.
Xu, G. Q.
Chen, S.
Wang, X. S.
Wee, A. T. S.
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doi_str_mv 10.1103/PhysRevB.75.073407
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title Quantitative analysis of Si mass transport during formation of Cu ∕ Si ( 111 ) − ( 5 × 5 ) from scanning tunneling microscopy
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