Ballistic-electron-emission microscopy of conduction-electron surface states
Gespeichert in:
| Veröffentlicht in: | Physical review. B, Condensed matter Condensed matter, 2000-03, Vol.61 (11), p.7161-7164 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 7164 |
|---|---|
| container_issue | 11 |
| container_start_page | 7161 |
| container_title | Physical review. B, Condensed matter |
| container_volume | 61 |
| creator | Weilmeier, M. K. Rippard, W. H. Buhrman, R. A. |
| description | |
| doi_str_mv | 10.1103/PhysRevB.61.7161 |
| format | Article |
| fullrecord | <record><control><sourceid>crossref</sourceid><recordid>TN_cdi_crossref_primary_10_1103_PhysRevB_61_7161</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1103_PhysRevB_61_7161</sourcerecordid><originalsourceid>FETCH-LOGICAL-c307t-617fc1a4ce832e1d67ae61e6101f2de21f9839e8e7fb025d5c84be46444992603</originalsourceid><addsrcrecordid>eNo1kE9LxDAUxIMouK7ePfYLpOYlbdoc3cV_UFBEzyGbvmCkbZa-rtBv7xbXYWAuwzD8GLsFkQMIdff2NdM7_mxyDXkFGs7YCoQpuapMec5WArTiUEtzya6IvsVRUpsVazau6yJN0XPs0E9jGjj2kSimIeujHxP5tJ-zFDKfhvbgp7g0TtWMDmNwHjOa3IR0zS6C6whvTrlmn48PH9tn3rw-vWzvG-6VqCauoQoeXOGxVhKh1ZVDDUcLCLJFCcHUymCNVdgJWbalr4sdFrooCmOkFmrNxN_uco9GDHY_xt6NswVhFxr2n4bVYBca6hexFVYw</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Ballistic-electron-emission microscopy of conduction-electron surface states</title><source>American Physical Society Journals</source><creator>Weilmeier, M. K. ; Rippard, W. H. ; Buhrman, R. A.</creator><creatorcontrib>Weilmeier, M. K. ; Rippard, W. H. ; Buhrman, R. A.</creatorcontrib><identifier>ISSN: 0163-1829</identifier><identifier>EISSN: 1095-3795</identifier><identifier>DOI: 10.1103/PhysRevB.61.7161</identifier><language>eng</language><ispartof>Physical review. B, Condensed matter, 2000-03, Vol.61 (11), p.7161-7164</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c307t-617fc1a4ce832e1d67ae61e6101f2de21f9839e8e7fb025d5c84be46444992603</citedby><cites>FETCH-LOGICAL-c307t-617fc1a4ce832e1d67ae61e6101f2de21f9839e8e7fb025d5c84be46444992603</cites></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><link.rule.ids>314,780,784,2876,2877,27924,27925</link.rule.ids></links><search><creatorcontrib>Weilmeier, M. K.</creatorcontrib><creatorcontrib>Rippard, W. H.</creatorcontrib><creatorcontrib>Buhrman, R. A.</creatorcontrib><title>Ballistic-electron-emission microscopy of conduction-electron surface states</title><title>Physical review. B, Condensed matter</title><issn>0163-1829</issn><issn>1095-3795</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2000</creationdate><recordtype>article</recordtype><recordid>eNo1kE9LxDAUxIMouK7ePfYLpOYlbdoc3cV_UFBEzyGbvmCkbZa-rtBv7xbXYWAuwzD8GLsFkQMIdff2NdM7_mxyDXkFGs7YCoQpuapMec5WArTiUEtzya6IvsVRUpsVazau6yJN0XPs0E9jGjj2kSimIeujHxP5tJ-zFDKfhvbgp7g0TtWMDmNwHjOa3IR0zS6C6whvTrlmn48PH9tn3rw-vWzvG-6VqCauoQoeXOGxVhKh1ZVDDUcLCLJFCcHUymCNVdgJWbalr4sdFrooCmOkFmrNxN_uco9GDHY_xt6NswVhFxr2n4bVYBca6hexFVYw</recordid><startdate>20000315</startdate><enddate>20000315</enddate><creator>Weilmeier, M. K.</creator><creator>Rippard, W. H.</creator><creator>Buhrman, R. A.</creator><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>20000315</creationdate><title>Ballistic-electron-emission microscopy of conduction-electron surface states</title><author>Weilmeier, M. K. ; Rippard, W. H. ; Buhrman, R. A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c307t-617fc1a4ce832e1d67ae61e6101f2de21f9839e8e7fb025d5c84be46444992603</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2000</creationdate><toplevel>online_resources</toplevel><creatorcontrib>Weilmeier, M. K.</creatorcontrib><creatorcontrib>Rippard, W. H.</creatorcontrib><creatorcontrib>Buhrman, R. A.</creatorcontrib><collection>CrossRef</collection><jtitle>Physical review. B, Condensed matter</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Weilmeier, M. K.</au><au>Rippard, W. H.</au><au>Buhrman, R. A.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Ballistic-electron-emission microscopy of conduction-electron surface states</atitle><jtitle>Physical review. B, Condensed matter</jtitle><date>2000-03-15</date><risdate>2000</risdate><volume>61</volume><issue>11</issue><spage>7161</spage><epage>7164</epage><pages>7161-7164</pages><issn>0163-1829</issn><eissn>1095-3795</eissn><doi>10.1103/PhysRevB.61.7161</doi><tpages>4</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0163-1829 |
| ispartof | Physical review. B, Condensed matter, 2000-03, Vol.61 (11), p.7161-7164 |
| issn | 0163-1829 1095-3795 |
| language | eng |
| recordid | cdi_crossref_primary_10_1103_PhysRevB_61_7161 |
| source | American Physical Society Journals |
| title | Ballistic-electron-emission microscopy of conduction-electron surface states |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-07T18%3A58%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Ballistic-electron-emission%20microscopy%20of%20conduction-electron%20surface%20states&rft.jtitle=Physical%20review.%20B,%20Condensed%20matter&rft.au=Weilmeier,%20M.%20K.&rft.date=2000-03-15&rft.volume=61&rft.issue=11&rft.spage=7161&rft.epage=7164&rft.pages=7161-7164&rft.issn=0163-1829&rft.eissn=1095-3795&rft_id=info:doi/10.1103/PhysRevB.61.7161&rft_dat=%3Ccrossref%3E10_1103_PhysRevB_61_7161%3C/crossref%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |