High spatiotemporal-resolution imaging in the scanning transmission electron microscope

The temporal resolution in scanning transmission electron microscopy (STEM) is limited by scanning system of an electron probe, leading to only a few frames per second (fps) at most in the current microscopes. This situation enforces us to stay atomic-resolution STEM imaging and spectroscopy in the...

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Veröffentlicht in:Microscopy 2020-08, Vol.69 (4), p.240-247
Hauptverfasser: Ishikawa, Ryo, Jimbo, Yu, Terao, Mitsuhisa, Nishikawa, Masashi, Ueno, Yujiro, Morishita, Shigeyuki, Mukai, Masaki, Shibata, Naoya, Ikuhara, Yuichi
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Sprache:eng
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Zusammenfassung:The temporal resolution in scanning transmission electron microscopy (STEM) is limited by scanning system of an electron probe, leading to only a few frames per second (fps) at most in the current microscopes. This situation enforces us to stay atomic-resolution STEM imaging and spectroscopy in the state of static observations. To push the boundary of atomic-resolution STEM imaging into dynamic observations, an unprecedentedly faster scanning system combined with fast electron detection systems should be prerequisite. Here we develop a new scanning probe system with the acquisition time of 83 nanoseconds per pixel and the fly-back time of 35 microseconds, leading to 25 fps STEM imaging with the image size of 512 × 512 pixels that is faster than a human perception speed. Using such high-speed probe scanning system, we have demonstrated the observations of shape-transformation of Pt nanoparticle and Pt single atomic motions on TiO2 (110) surface at atomic-resolution with the temporal resolution of 40 milliseconds. The present probe scanning system opens the door to use atomic-resolution STEM imaging for in-situ observation of materials dynamics under the temperatures of cooling or heating, the atmosphere of liquid or gas, electric-basing or mechanical test.
ISSN:2050-5701
2050-5701
DOI:10.1093/jmicro/dfaa017