Axial peak extraction in the measurement of subsurface structures with annular illumination confocal microscopy

Three-dimensional dark-field confocal microscopy (DFCM) using annular illumination and complementary detection apertures is capable of detecting subsurface defects in ultra-precision optical components. In this study, a DFCM tuning algorithm for large apertures is proposed based on the sinc 2 tuning...

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Veröffentlicht in:Surface topography metrology and properties 2024-09, Vol.12 (3), p.35030
Hauptverfasser: Jiang, Yong, Liu, Chenguang, Zou, Chongliang, Liu, Jian
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Sprache:eng
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Zusammenfassung:Three-dimensional dark-field confocal microscopy (DFCM) using annular illumination and complementary detection apertures is capable of detecting subsurface defects in ultra-precision optical components. In this study, a DFCM tuning algorithm for large apertures is proposed based on the sinc 2 tuning model. This algorithm provides a reliable and theoretically accurate method for extracting the axial position during the measurement of subsurface defects. The rationality and accuracy of this method are verified through simulations and experimental results.
ISSN:2051-672X
2051-672X
DOI:10.1088/2051-672X/ad6b3c