Exploring the influence of nanocavity alignment on slow light generation via multiple EIT and Fano resonances in square lattice plasmonic silver nanostructures

In this paper, we present a comprehensive investigation of multiple electromagnetic induced transparency (EIT) and Fano resonances in a square lattice plasmonic nanostructure, which is composed of four silver slabs arranged in a square configuration, with each slab featuring a cylindrical nanocavity...

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Veröffentlicht in:Journal of optics (2010) 2023-10, Vol.25 (10), p.105002
Hauptverfasser: Khan, Haseeb Ahmad, Khan, Adnan Daud, Shah, Syed Waqar, Chaudhry, Muhammad Rehan, Azeem, Farhan, Ahmed, Salman, Ahmad, Khurshid
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Sprache:eng
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Zusammenfassung:In this paper, we present a comprehensive investigation of multiple electromagnetic induced transparency (EIT) and Fano resonances in a square lattice plasmonic nanostructure, which is composed of four silver slabs arranged in a square configuration, with each slab featuring a cylindrical nanocavity at its center. Initially, symmetric structures were analyzed to explore the potential for achieving EIT effects. Subsequently, we introduce deliberate symmetry breaking by precisely aligning the nanocavity in a controlled manner, first within a single slab, then in combinations of two, three, and all four slabs simultaneously. This controlled alignment strategy enabled the relaxation of dipole coupling selection rules, leading to the mixing of dipole and higher-order modes. The interaction between these modes resulted in the generation of multiple EITs and Fano resonances in the optical spectrum. Furthermore, the effective group index was evaluated for the optimal results obtained in the single, double, triple, and four symmetry reduced structures. High group index values were observed in the vicinity of the EIT and Fano resonances, with a remarkable maximum group index value of 6900 achieved within the EIT window. These findings highlight the significant potential of these structures in the design of slow light devices and sensitive sensors.
ISSN:2040-8978
2040-8986
DOI:10.1088/2040-8986/acf053