Study of the retardance of a birefringent waveplate at tilt incidence by Mueller matrix ellipsometer

Birefringent waveplates are indispensable optical elements for polarization state modification in various optical systems. The retardance of a birefringent waveplate will change significantly when the incident angle of the light varies. Therefore, it is of great importance to study such field-of-view errors on the polarization properties, especially the retardance of a birefringent waveplate, for the performance improvement of the system. In this paper, we propose a generalized retardance formula at arbitrary incidence and azimuth for a general plane-parallel composite waveplate consisting of multiple aligned single waveplates. An efficient method and corresponding experimental set-up have been developed to characterize the retardance versus the field-of-view angle based on a constructed spectroscopic Mueller matrix ellipsometer. Both simulations and experiments on an MgF2 biplate over an incident angle of 0°-8° and an azimuthal angle of 0°-360° are presented as an example, and the dominant experimental errors are discussed and corrected. The experimental results strongly agree with the simulations with a maximum difference of 0.15° over the entire field of view, which indicates the validity and great potential of the presented method for birefringent waveplate characterization at tilt incidence.