Growth and characterization of few unit-cell NbN superconducting films on 3C-SiC/Si substrate

Superconducting δ-NbN ultrathin film has become a key element in extremely sensitive detector applications in recent decades because of its excellent electronic properties. We have realized the epitaxial growth of ultrathin δ-NbN films on (100)-oriented 3C-SiC/Si substrates by dc reactive magnetron...

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Veröffentlicht in:Superconductor science & technology 2017-10, Vol.30 (11), p.115010
Hauptverfasser: Chang, H W, Wang, C L, Huang, Y R, Chen, T J, Wang, M J
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Sprache:eng
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Zusammenfassung:Superconducting δ-NbN ultrathin film has become a key element in extremely sensitive detector applications in recent decades because of its excellent electronic properties. We have realized the epitaxial growth of ultrathin δ-NbN films on (100)-oriented 3C-SiC/Si substrates by dc reactive magnetron sputtering at 760 °C with a deposition rate of 0.054 nm s−1. High-resolution transmission electron microscope images confirm the excellent epitaxy of these films. Even with a thickness of 1.3 nm (∼3 unit cells), the δ-NbN film shows a superconducting transition above 8 K. Furthermore, our ultrathin δ-NbN films demonstrate a long Ginzburg-Landau superconducting coherent length ( G L ( 0 ) > 5 nm ) with a critical current density of about 2.2 MA cm−2, and good stability in an ambient environment.
ISSN:0953-2048
1361-6668
DOI:10.1088/1361-6668/aa8616