The investigation of stability of n-CdS/p-Cu 2 S solar cells prepared by cold substrate method
In this study, two different n-CdS/p-Cu 2 S solar cells were prepared by evaporating Cu at different substrate temperatures (200 K and 300 K) by vacuum evaporation method on a single crystal CdS semiconductor. Field emission scanning electron microscope images showed that the Cu layer obtained at a...
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Veröffentlicht in: | Semiconductor science and technology 2021-03, Vol.36 (3), p.35021 |
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Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | In this study, two different n-CdS/p-Cu
2
S solar cells were prepared by evaporating Cu at different substrate temperatures (200 K and 300 K) by vacuum evaporation method on a single crystal CdS semiconductor. Field emission scanning electron microscope images showed that the Cu layer obtained at a temperature of 200 K was composed of nanoparticles in accordance with the soliton growth mechanism. Cu film thickness was determined as 395 ∓ 0.76 nm at 300 K substrate temperature and 187 ∓ 0.45 nm at 200 K substrate temperature. The current–voltage (
I
–
V
) and capacitance–voltage (
C
–
V
) characteristics of the solar cells were examined for 12 weeks in dark and light environments. Open-circuit voltage (
V
oc
), short-circuit current (
I
sc
), maximum power (
P
max
), filling factor and efficiency (
η
) were calculated from
I
–
V
measurements. For the prepared solar cells, the highest efficiency value was obtained in the 7th week (
η
= 0.1360) at 200 K substrate temperature, while it was obtained in the 5th week (
η
= 0.0384) at 300 K substrate temperature. From
C
–
V
measurements, donor density (
N
d
) and barrier potential (
V
bi
) were calculated. The solar cell produced at 200 K substrate temperature has higher donor density (1st week 2.99 × 10
16
cm
−3
) and barrier potential values (12th week 0.411 V). At the end of the 12-week period, the deterioration rate of solar cells created at 200 K and 300 K substrate temperatures was 51% and 94%, respectively. |
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ISSN: | 0268-1242 1361-6641 |
DOI: | 10.1088/1361-6641/abe05c |