Room temperature low frequency noise in n+-InAs/n-InAsSbP/InAs/p-InAsSbP double heterostructure infrared photodiodes

Low frequency forward current noise as well as the photocurrent noise are studied in InAsSbP/InAs double heterostructure (DH) photodiodes, in the frequency range 1-104 Hz. The photocurrent noise in DH photodiodes is significantly lower than in single heterostructure (SH) photodiodes. The forward cur...

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Veröffentlicht in:Semiconductor science and technology 2019-10, Vol.34 (10), p.105015
Hauptverfasser: Dyakonova, N V, Karandashev, S A, Levinshtein, M E, Matveev, B A, Remennyi, M A
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Sprache:eng
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Zusammenfassung:Low frequency forward current noise as well as the photocurrent noise are studied in InAsSbP/InAs double heterostructure (DH) photodiodes, in the frequency range 1-104 Hz. The photocurrent noise in DH photodiodes is significantly lower than in single heterostructure (SH) photodiodes. The forward current noise in a DH diode exhibiting the 1/f frequency dependence is also much lower than that in SH diodes. However, in some DH diodes, it is the generation-recombination mechanism that provides the dominant contribution to the forward current noise; in this case the noise level is significantly higher. At sufficiently high forward current densities, the noise decreases with current. The observed generation-recombination noise spectrum cannot be described within the conventional theory.
ISSN:0268-1242
1361-6641
DOI:10.1088/1361-6641/ab3c3e