Thickness and temperature dependent thermoelectric properties of Bi 87 Sb 13 nanofilms measured with a novel measurement platform

Thickness and temperature dependent thermoelectric properties of Bi 87 Sb 13 nanofilms measured with a novel measurement platform

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Veröffentlicht in:Semiconductor science and technology 2018-08, Vol.33 (8), p.85014
Hauptverfasser: Linseis, V, Völklein, F, Reith, H, Hühne, R, Schnatmann, L, Nielsch, K, Woias, P
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container_title Semiconductor science and technology
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creator Linseis, V
Völklein, F
Reith, H
Hühne, R
Schnatmann, L
Nielsch, K
Woias, P
description
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title Thickness and temperature dependent thermoelectric properties of Bi 87 Sb 13 nanofilms measured with a novel measurement platform
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