Chandra Multiwavelength Project X-Ray Point Source Catalog

We present the Chandra Multiwavelength Project (ChaMP) X-ray point source catalog with 66800 X-ray sources detected in 149 Chandra observations covering 610 deg super(2). The full ChaMP catalog sample is 7 times larger than the initial published ChaMP catalog. The exposure time of the fields in our sample ranges from 0.9 to 124 ks, corresponding to a deepest X-ray flux limit of f sub(0.5-8.0) = 9 x 10 super(-16) ergs cm super(-2) s super(-1). The ChaMP X-ray data have been uniformly reduced and analyzed with ChaMP-specific pipelines and then carefully validated by visual inspection. The ChaMP catalog includes X-ray photometric data in eight different energy bands as well as X-ray spectral hardness ratios and colors. To best utilize the ChaMP catalog, we also present the source reliability, detection probability, and positional uncertainty. To quantitatively assess those parameters, we performed extensive simulations. In particular, we present a set of empirical equations: the flux limit as a function of effective exposure time and the positional uncertainty as a function of source counts and off-axis angle. The false source detection rate is 61% of all detected ChaMP sources, while the detection probability is better than 695% for sources with counts 30 and off-axis angle < 5'. The typical positional offset between ChaMP X-ray source and their SDSS optical counterparts is 0.7" c 0.4", derived from 6900 matched sources.