How to analyse relaxation and leakage currents of dielectric thin films: Simulation of voltage-step and voltage-ramp techniques

An empirical electrical equivalent circuit for dielectric thin films, based on experimental data, is developed. Current responses to voltage-steps and to voltage-ramps are calculated and compared with experimental data. The simulation allows us to separate current contributions of different physical...

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Veröffentlicht in:	Integrated ferroelectrics 1995-05, Vol.8 (3-4), p.317-332
Hauptverfasser:	Dietz, Guido W., Waser, Rainer
Format:	Artikel
Sprache:	eng
Schlagworte:	dielectric relaxation impedance spectroscopy leakage current Thin films titanate
Online-Zugang:	Volltext
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