Structure-property relations in polycrystalline titanate thin films

Ferroelectric Pb(Zr,Ti)O 3 films have been deposited by spin-coating techniques, applying a modified sol-gel process. The growth of the thin films as a function of processing has been investigated by structural analyses using XRD, XRF, SEM and TEM methods. The data are the basis for the discussion o...

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Veröffentlicht in:	Integrated ferroelectrics 1994-05, Vol.4 (3), p.197-206
Hauptverfasser:	Klee, M., de Veirman, A., Taylor, D. J., Larsen, P. K.
Format:	Artikel
Sprache:	eng
Schlagworte:	fatigue retention sol-gel processing TEM studies titanate thin films x-ray fluorescence analysis
Online-Zugang:	Volltext
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Beschreibung
Zusammenfassung:	Ferroelectric Pb(Zr,Ti)O 3 films have been deposited by spin-coating techniques, applying a modified sol-gel process. The growth of the thin films as a function of processing has been investigated by structural analyses using XRD, XRF, SEM and TEM methods. The data are the basis for the discussion of the ferroelectric properties of the layers.
ISSN:	1058-4587 1607-8489
DOI:	10.1080/10584589408017022