A γ-ray and small-angle neutron scattering study of oxygen precipitation in silicon single crystals
Oxygen precipitation in heat-treated Czochralski-grown silicon single crystals has been investigated using γ-ray diffraction combined with small-angle neutron scattering and infrared absorption measurements. Diffuse scattering around the diffraction peaks was observed using γ-rays and this is associ...
Gespeichert in:
Veröffentlicht in: | Philosophical magazine letters 1988-10, Vol.58 (4), p.183-188 |
---|---|
Hauptverfasser: | , , |
Format: | Artikel |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | Oxygen precipitation in heat-treated Czochralski-grown silicon single crystals has been investigated using γ-ray diffraction combined with small-angle neutron scattering and infrared absorption measurements. Diffuse scattering around the diffraction peaks was observed using γ-rays and this is associated with oxygen precipitation in the silicon lattice. The analysis of the diffuse scattering produces an average precipitate size in agreement with small-angle neutron scattering measurements. |
---|---|
ISSN: | 0950-0839 1362-3036 |
DOI: | 10.1080/09500838808214751 |