Analysis of X-ray and electron-beam diffraction patterns from poly(dipropyl siloxane)
The crystalline polysiloxane (-R2SiO-)n. where R= n-propyl, has been characterized through high-resolution X-ray diffraction patterns of the polycrystalline material and selected-area electron-beam diffraction patterns of single crystals. The smallest unit cell consistent with the diffraction data i...
Gespeichert in:
| Veröffentlicht in: | Journal of macromolecular science. Physics 1969-09, Vol.3 (3), p.519-523 |
|---|---|
| Hauptverfasser: | , , |
| Format: | Artikel |
| Sprache: | eng |
| Online-Zugang: | Volltext |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | 523 |
|---|---|
| container_issue | 3 |
| container_start_page | 519 |
| container_title | Journal of macromolecular science. Physics |
| container_volume | 3 |
| creator | Petersen, D.R. Carter, D.R Lee, C.L. |
| description | The crystalline polysiloxane (-R2SiO-)n. where R= n-propyl, has been characterized through high-resolution X-ray diffraction patterns of the polycrystalline material and selected-area electron-beam diffraction patterns of single crystals. The smallest unit cell consistent with the diffraction data is tetragonal, with dimensions a = 9.52 * 0.01 and c = 9.40 ± 0.05 . The probable space group is P41 (or P43). |
| doi_str_mv | 10.1080/00222346908217104 |
| format | Article |
| fullrecord | <record><control><sourceid>crossref_infor</sourceid><recordid>TN_cdi_crossref_primary_10_1080_00222346908217104</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>10_1080_00222346908217104</sourcerecordid><originalsourceid>FETCH-LOGICAL-c364t-e978d3064148361a218d40a11de0cb29bc1509d17e3c437e4db7df823c65d6423</originalsourceid><addsrcrecordid>eNp1kE1LxDAQhoMouK7-AG856iGaSdK0BS_L4hcseHFhbyXNB0TSpCQF7b-3st7EubyHeZ-BeRC6BnoHtKH3lDLGuJAtbRjUQMUJWkHFKiJpezhFq589WQrNOboo5YMuw2tYof0mqjAXX3By-ECymrGKBttg9ZRTJL1VAzbeuaz05FPEo5omm2PBLqcBjynMN8aPOY1zwMWH9KWivb1EZ06FYq9-c432T4_v2xeye3t-3W52RHMpJmLbujGcSgGi4RIUg8YIqgCMpbpnba-hoq2B2nIteG2F6WvjGsa1rIwUjK8RHO_qnErJ1nVj9oPKcwe0-_HS_fGyMA9HxkeX8qA-Uw6mm9QcUl6-jNqXjv-PfwOuDGhP</addsrcrecordid><sourcetype>Aggregation Database</sourcetype><iscdi>true</iscdi><recordtype>article</recordtype></control><display><type>article</type><title>Analysis of X-ray and electron-beam diffraction patterns from poly(dipropyl siloxane)</title><source>Access via Taylor & Francis</source><creator>Petersen, D.R. ; Carter, D.R ; Lee, C.L.</creator><creatorcontrib>Petersen, D.R. ; Carter, D.R ; Lee, C.L.</creatorcontrib><description>The crystalline polysiloxane (-R2SiO-)n. where R= n-propyl, has been characterized through high-resolution X-ray diffraction patterns of the polycrystalline material and selected-area electron-beam diffraction patterns of single crystals. The smallest unit cell consistent with the diffraction data is tetragonal, with dimensions a = 9.52 * 0.01 and c = 9.40 ± 0.05 . The probable space group is P41 (or P43).</description><identifier>ISSN: 0022-2348</identifier><identifier>EISSN: 1525-609X</identifier><identifier>DOI: 10.1080/00222346908217104</identifier><language>eng</language><publisher>Taylor & Francis Group</publisher><ispartof>Journal of macromolecular science. Physics, 1969-09, Vol.3 (3), p.519-523</ispartof><rights>Copyright Taylor & Francis Group, LLC 1969</rights><lds50>peer_reviewed</lds50><woscitedreferencessubscribed>false</woscitedreferencessubscribed><citedby>FETCH-LOGICAL-c364t-e978d3064148361a218d40a11de0cb29bc1509d17e3c437e4db7df823c65d6423</citedby></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktopdf>$$Uhttps://www.tandfonline.com/doi/pdf/10.1080/00222346908217104$$EPDF$$P50$$Ginformaworld$$H</linktopdf><linktohtml>$$Uhttps://www.tandfonline.com/doi/full/10.1080/00222346908217104$$EHTML$$P50$$Ginformaworld$$H</linktohtml><link.rule.ids>314,780,784,27924,27925,59647,60436</link.rule.ids></links><search><creatorcontrib>Petersen, D.R.</creatorcontrib><creatorcontrib>Carter, D.R</creatorcontrib><creatorcontrib>Lee, C.L.</creatorcontrib><title>Analysis of X-ray and electron-beam diffraction patterns from poly(dipropyl siloxane)</title><title>Journal of macromolecular science. Physics</title><description>The crystalline polysiloxane (-R2SiO-)n. where R= n-propyl, has been characterized through high-resolution X-ray diffraction patterns of the polycrystalline material and selected-area electron-beam diffraction patterns of single crystals. The smallest unit cell consistent with the diffraction data is tetragonal, with dimensions a = 9.52 * 0.01 and c = 9.40 ± 0.05 . The probable space group is P41 (or P43).</description><issn>0022-2348</issn><issn>1525-609X</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>1969</creationdate><recordtype>article</recordtype><recordid>eNp1kE1LxDAQhoMouK7-AG856iGaSdK0BS_L4hcseHFhbyXNB0TSpCQF7b-3st7EubyHeZ-BeRC6BnoHtKH3lDLGuJAtbRjUQMUJWkHFKiJpezhFq589WQrNOboo5YMuw2tYof0mqjAXX3By-ECymrGKBttg9ZRTJL1VAzbeuaz05FPEo5omm2PBLqcBjynMN8aPOY1zwMWH9KWivb1EZ06FYq9-c432T4_v2xeye3t-3W52RHMpJmLbujGcSgGi4RIUg8YIqgCMpbpnba-hoq2B2nIteG2F6WvjGsa1rIwUjK8RHO_qnErJ1nVj9oPKcwe0-_HS_fGyMA9HxkeX8qA-Uw6mm9QcUl6-jNqXjv-PfwOuDGhP</recordid><startdate>19690901</startdate><enddate>19690901</enddate><creator>Petersen, D.R.</creator><creator>Carter, D.R</creator><creator>Lee, C.L.</creator><general>Taylor & Francis Group</general><scope>AAYXX</scope><scope>CITATION</scope></search><sort><creationdate>19690901</creationdate><title>Analysis of X-ray and electron-beam diffraction patterns from poly(dipropyl siloxane)</title><author>Petersen, D.R. ; Carter, D.R ; Lee, C.L.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c364t-e978d3064148361a218d40a11de0cb29bc1509d17e3c437e4db7df823c65d6423</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>1969</creationdate><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Petersen, D.R.</creatorcontrib><creatorcontrib>Carter, D.R</creatorcontrib><creatorcontrib>Lee, C.L.</creatorcontrib><collection>CrossRef</collection><jtitle>Journal of macromolecular science. Physics</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Petersen, D.R.</au><au>Carter, D.R</au><au>Lee, C.L.</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Analysis of X-ray and electron-beam diffraction patterns from poly(dipropyl siloxane)</atitle><jtitle>Journal of macromolecular science. Physics</jtitle><date>1969-09-01</date><risdate>1969</risdate><volume>3</volume><issue>3</issue><spage>519</spage><epage>523</epage><pages>519-523</pages><issn>0022-2348</issn><eissn>1525-609X</eissn><abstract>The crystalline polysiloxane (-R2SiO-)n. where R= n-propyl, has been characterized through high-resolution X-ray diffraction patterns of the polycrystalline material and selected-area electron-beam diffraction patterns of single crystals. The smallest unit cell consistent with the diffraction data is tetragonal, with dimensions a = 9.52 * 0.01 and c = 9.40 ± 0.05 . The probable space group is P41 (or P43).</abstract><pub>Taylor & Francis Group</pub><doi>10.1080/00222346908217104</doi><tpages>5</tpages></addata></record> |
| fulltext | fulltext |
| identifier | ISSN: 0022-2348 |
| ispartof | Journal of macromolecular science. Physics, 1969-09, Vol.3 (3), p.519-523 |
| issn | 0022-2348 1525-609X |
| language | eng |
| recordid | cdi_crossref_primary_10_1080_00222346908217104 |
| source | Access via Taylor & Francis |
| title | Analysis of X-ray and electron-beam diffraction patterns from poly(dipropyl siloxane) |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-27T12%3A05%3A45IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-crossref_infor&rft_val_fmt=info:ofi/fmt:kev:mtx:journal&rft.genre=article&rft.atitle=Analysis%20of%20X-ray%20and%20electron-beam%20diffraction%20patterns%20from%20poly(dipropyl%20siloxane)&rft.jtitle=Journal%20of%20macromolecular%20science.%20Physics&rft.au=Petersen,%20D.R.&rft.date=1969-09-01&rft.volume=3&rft.issue=3&rft.spage=519&rft.epage=523&rft.pages=519-523&rft.issn=0022-2348&rft.eissn=1525-609X&rft_id=info:doi/10.1080/00222346908217104&rft_dat=%3Ccrossref_infor%3E10_1080_00222346908217104%3C/crossref_infor%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |