Analysis of X-ray and electron-beam diffraction patterns from poly(dipropyl siloxane)

Analysis of X-ray and electron-beam diffraction patterns from poly(dipropyl siloxane)

The crystalline polysiloxane (-R2SiO-)n. where R= n-propyl, has been characterized through high-resolution X-ray diffraction patterns of the polycrystalline material and selected-area electron-beam diffraction patterns of single crystals. The smallest unit cell consistent with the diffraction data i...

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Veröffentlicht in:Journal of macromolecular science. Physics 1969-09, Vol.3 (3), p.519-523
Hauptverfasser: Petersen, D.R., Carter, D.R, Lee, C.L.
Format: Artikel
Sprache:eng
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Zusammenfassung:The crystalline polysiloxane (-R2SiO-)n. where R= n-propyl, has been characterized through high-resolution X-ray diffraction patterns of the polycrystalline material and selected-area electron-beam diffraction patterns of single crystals. The smallest unit cell consistent with the diffraction data is tetragonal, with dimensions a = 9.52 * 0.01 and c = 9.40 ± 0.05 . The probable space group is P41 (or P43).
ISSN:0022-2348
1525-609X
DOI:10.1080/00222346908217104