Measurement of the carrier envelope offset frequency of a femtosecond frequency comb using a Fabry—Perot interferometer

A method for measuring the carrier envelope offset (CEO) frequency of the femtosecond frequency comb with a bandwidth of less than one octave by using a Fabry-Perot interferometer is proposed and experimentally demonstrated. (laser components)

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Quantum electronics (Woodbury, N.Y.) N.Y.), 2010-10, Vol.40 (8), p.733-738
Hauptverfasser:	Basnak, D V, Bikmukhametov, K A, Dmitriev, Aleksandr K, Dmitrieva, N I, Lugovoi, A A, Pokasov, P V, Chepurov, S V
Format:	Artikel
Sprache:	eng
Schlagworte:	CARRIERS FABRY-PEROT INTERFEROMETER FREQUENCY MEASUREMENT INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY INTERFEROMETERS MEASURING INSTRUMENTS
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A method for measuring the carrier envelope offset (CEO) frequency of the femtosecond frequency comb with a bandwidth of less than one octave by using a Fabry-Perot interferometer is proposed and experimentally demonstrated. (laser components)
ISSN:	1063-7818 1468-4799
DOI:	10.1070/QE2010v040n08ABEH014354