X-ray source improvements for EXAFS measurement on SGIII prototype facility

A proper x-ray source is crucial to extended x-ray absorption fine structure (EXAFS) measurement as parameter diagnosis for compressed materials on large laser facilities. In this article, modification of the CH capsule as an x-ray source has been done through simulations and experiments for the SGI...

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Veröffentlicht in:AIP advances 2020-05, Vol.10 (5), p.055313-055313-12
Hauptverfasser: Hu, Yun, Jiang, Shaoen, Zhang, Jiyan, Xue, Quanxi, Wang, Zhebin, Ye, Qing
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Sprache:eng
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Zusammenfassung:A proper x-ray source is crucial to extended x-ray absorption fine structure (EXAFS) measurement as parameter diagnosis for compressed materials on large laser facilities. In this article, modification of the CH capsule as an x-ray source has been done through simulations and experiments for the SGIII prototype laser facility. On the one hand, simulation results show that the radiation intensity of the CH capsule increases largely while wall thickness decreases. On the other hand, chlorine atoms whose atomic number is higher than that of carbon were brought into the capsule by doping on the inner side wall to enhance x-ray radiation intensity. CH capsules were designed, and experiments were carried out on the SGIII prototype laser facility. The x-ray source spectrum, size, radiation intensity, radiation pulse, and Ti K-edge EXAFS spectrum under ambient conditions were compared and discussed. Experimental results show that, with the doping of chlorine atoms and decreasing the wall thickness from 9 µm to 6 µm, the x-ray radiation intensity increases by about 63.5 times, energy efficiency is improved a lot, and other properties are also improved. The chlorine atom doped CH capsule with 6 µm wall thickness is proved to be the best x-ray source in the experiments in this article. Its size is 57 ± 0.5 µm, pulse width is 240 ps, and radiation intensity is about 9.1 times the undoped one with the same wall thickness. The methods can be extended to other laser facilities for the EXAFS measurement of other materials.
ISSN:2158-3226
2158-3226
DOI:10.1063/5.0007645