Comment on ‘‘Low-frequency excess noise in Nb-Al2O3-Nb Josephson tunnel junctions’’ [Appl. Phys. Lett. 5 0 , 1757 (1987)]

The 1/f noise in a josephson junction as measured by Savo et al. can b terpreted in terms of transparency fluctuations induced by Nyquist noise i n th aluminium oxide layer. (AIP)

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Veröffentlicht in:Applied physics letters 1988-06, Vol.52 (23), p.2001-2001
1. Verfasser: Kleinpenning, T. G. M.
Format: Artikel
Sprache:eng
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Zusammenfassung:The 1/f noise in a josephson junction as measured by Savo et al. can b terpreted in terms of transparency fluctuations induced by Nyquist noise i n th aluminium oxide layer. (AIP)
ISSN:0003-6951
1077-3118
DOI:10.1063/1.99600