Pulsed CO2 laser etching of polyimide

Etching of thin polyimide films in air was investigated using a line tunable, pulsed CO2 laser. The threshold fluence for etching at a wavelength of 944 cm−1 (10.6 μm) exceeds that at 1087 cm−1 (9.2 μm) by a factor of 4. This is consistent with the infrared absorption spectrum which shows polyimide...

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Veröffentlicht in:Applied physics letters 1986-05, Vol.48 (18), p.1226-1228
Hauptverfasser: BRANNON, J. H, LANKARD, J. R
Format: Artikel
Sprache:eng
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Zusammenfassung:Etching of thin polyimide films in air was investigated using a line tunable, pulsed CO2 laser. The threshold fluence for etching at a wavelength of 944 cm−1 (10.6 μm) exceeds that at 1087 cm−1 (9.2 μm) by a factor of 4. This is consistent with the infrared absorption spectrum which shows polyimide to be significantly more absorbing at 1087 cm−1. As a result, etching at 1087 cm−1 produces a cleaner, more precisely defined region. Analysis of the vapors generated during laser etching shows the simple gases CO2, H2O, and CO to be present.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.96989