Role of tip structure in scanning tunneling microscopy
An ultrahigh vacuum scanning tunneling microscope (STM) equipped with a field ion microscope (FIM) has been built. By using the FIM image, a tungsten tip was tailored for high STM resolution in a scan of the Au(001) surface. The measured corrugation depth of the (1×5) rows was found to be a function...
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| Veröffentlicht in: | Applied physics letters 1986-06, Vol.48 (23), p.1597-1599 |
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| container_title | Applied physics letters |
| container_volume | 48 |
| creator | KUK, Y SILVERMAN, P. J |
| description | An ultrahigh vacuum scanning tunneling microscope (STM) equipped with a field ion microscope (FIM) has been built. By using the FIM image, a tungsten tip was tailored for high STM resolution in a scan of the Au(001) surface. The measured corrugation depth of the (1×5) rows was found to be a function of the size of the atomic cluster on the first plane of the tungsten tip. |
| doi_str_mv | 10.1063/1.96828 |
| format | Article |
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| fulltext | fulltext |
| identifier | ISSN: 0003-6951 |
| ispartof | Applied physics letters, 1986-06, Vol.48 (23), p.1597-1599 |
| issn | 0003-6951 1077-3118 |
| language | eng |
| recordid | cdi_crossref_primary_10_1063_1_96828 |
| source | AIP Digital Archive |
| subjects | Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Metals, semimetals and alloys Phase diagrams and microstructures developed by solidification and solid-solid phase transformations Physics Solid surfaces and solid-solid interfaces Specific materials Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties) |
| title | Role of tip structure in scanning tunneling microscopy |
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