Role of tip structure in scanning tunneling microscopy

An ultrahigh vacuum scanning tunneling microscope (STM) equipped with a field ion microscope (FIM) has been built. By using the FIM image, a tungsten tip was tailored for high STM resolution in a scan of the Au(001) surface. The measured corrugation depth of the (1×5) rows was found to be a function...

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Veröffentlicht in:	Applied physics letters 1986-06, Vol.48 (23), p.1597-1599
Hauptverfasser:	KUK, Y, SILVERMAN, P. J
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Cross-disciplinary physics: materials science rheology Exact sciences and technology Materials science Metals, semimetals and alloys Phase diagrams and microstructures developed by solidification and solid-solid phase transformations Physics Solid surfaces and solid-solid interfaces Specific materials Surface structure and topography Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
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Beschreibung
Zusammenfassung:	An ultrahigh vacuum scanning tunneling microscope (STM) equipped with a field ion microscope (FIM) has been built. By using the FIM image, a tungsten tip was tailored for high STM resolution in a scan of the Au(001) surface. The measured corrugation depth of the (1×5) rows was found to be a function of the size of the atomic cluster on the first plane of the tungsten tip.
ISSN:	0003-6951 1077-3118
DOI:	10.1063/1.96828