Raman scattering study of the properties and removal of excess Te on CdTe surfaces

We have studied Raman scattering from CdTe 〈100〉, 〈110〉, and 〈111〉 surfaces subjected to various surface treatments. Our investigation shows that 0.1% Br/methanol etch or chemomechanical polish leaves a thin residual layer of polycrystalline Te of thickness 10–40 Å (under a tensile stress of about 8...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
Veröffentlicht in:	Applied physics letters 1984-10, Vol.45 (7), p.789-791
Hauptverfasser:	AMIRTHARAJ, P. M, POLLAK, F. H
Format:	Artikel
Sprache:	eng
Schlagworte:	Condensed matter: structure, mechanical and thermal properties Exact sciences and technology Physics Solid-fluid interfaces Surfaces and interfaces thin films and whiskers (structure and nonelectronic properties)
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	We have studied Raman scattering from CdTe 〈100〉, 〈110〉, and 〈111〉 surfaces subjected to various surface treatments. Our investigation shows that 0.1% Br/methanol etch or chemomechanical polish leaves a thin residual layer of polycrystalline Te of thickness 10–40 Å (under a tensile stress of about 8 kbar) and that this Te film can be removed by a rinse in a 1 N KOH in methanol solution.
ISSN:	0003-6951 1077-3118
DOI:	10.1063/1.95367