Characterization of trapping kinetics from the lifetime dependence of thermally stimulated conductivity spectra

Characterization of trapping kinetics from the lifetime dependence of thermally stimulated conductivity spectra

A technique is proposed for identifying trapping kinetics from thermally stimulated conductivity TSC) measurements, which is based on the influence of lifetime on TSC spectra. The same technique may be used to measure the trap energy if fast trapping dominates. The usefulness of the method is illust...

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Veröffentlicht in:Applied physics letters 1975-01, Vol.27 (1), p.29-31
Hauptverfasser: Rabie, S., Rumin, N.
Format: Artikel
Sprache:eng
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Zusammenfassung:A technique is proposed for identifying trapping kinetics from thermally stimulated conductivity TSC) measurements, which is based on the influence of lifetime on TSC spectra. The same technique may be used to measure the trap energy if fast trapping dominates. The usefulness of the method is illustrated with some results of measurements on Zn-compensated silicon.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.88254