External electron injection, trapping, and emittance evolution in the blow-out regime

In this work, we study electron side-injection and trapping in the blow-out regime in deep plasma channels. We analyze the maximum angle of injection, for which at least 90% of the injected electrons are trapped. We discuss the dependence of this angle on the electrons' initial energy and their...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Physics of plasmas 2018-12, Vol.25 (12)
Hauptverfasser: Pronold, Jari, Thomas, Johannes, Pukhov, Alexander
Format: Artikel
Sprache:eng
Schlagworte:
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:In this work, we study electron side-injection and trapping in the blow-out regime in deep plasma channels. We analyze the maximum angle of injection, for which at least 90% of the injected electrons are trapped. We discuss the dependence of this angle on the electrons' initial energy and their injection positions. In the scope of a semi-analytical blow-out model, we show that the injection position is a less critical factor for trapping if electrons are injected into deep plasma channels. Photonic integrated circuit simulations and analytical approximations support our results from the semi-analytical model. Furthermore, a discussion of the temporal evolution of the normalized radial emittance during the trapping process and further acceleration is presented.
ISSN:1070-664X
1089-7674
DOI:10.1063/1.5045355