Laboratory time-resolved X-ray diffractometry for investigation of reversible structural changes induced in single crystals by external electric field

Time-resolved technique of X-ray diffraction curve measurement was implemented at a laboratory X-ray source using a high-speed data acquisition system. The time resolution of up to 100 µs was achieved via this X-ray diffractometry technique in the experiment of rocking curve dynamics measurement in a piezoelectric lanthanum-gallium silicate crystal under the influence of high voltage periodic pulsed electric field with an amplitude of 3.08 kV/mm corresponding to the pre-breakdown state. This perturbation caused a quick angular shift of the rocking curve caused by crystal lattice deformation due to the piezoelectric effect. The absence of the diffraction curve broadening effect was shown as well as the absence of the other significant relaxation-like variations of the curve parameters which are inherent for the migration of charge carriers (ions or vacancies) under the external electric field.