Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction
Time-resolved X-ray diffraction (XRD) with synchrotron radiation while applying continuous voltage pulses was employed to investigate the electric-field-induced lattice distortion of an epitaxial BiFeO3 (BFO) thin film in a Pt/BFO (1 μm)/SrRuO3 (50 nm)/vicinal SrTiO3 (001) structure. XRD-reciprocal...
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| Veröffentlicht in: | Applied physics letters 2017-08, Vol.111 (8) |
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| container_title | Applied physics letters |
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| creator | Nakashima, Seiji Sakata, Osami Funakubo, Hiroshi Shimizu, Takao Ichinose, Daichi Takayama, Kota Imai, Yasuhiko Fujisawa, Hironori Shimizu, Masaru |
| description | Time-resolved X-ray diffraction (XRD) with synchrotron radiation while applying continuous voltage pulses was employed to investigate the electric-field-induced lattice distortion of an epitaxial BiFeO3 (BFO) thin film in a Pt/BFO (1 μm)/SrRuO3 (50 nm)/vicinal SrTiO3 (001) structure. XRD-reciprocal space maps based on the BFO 003, 114, and 1
1
¯
4 diffraction spots with and without the application of +15 V (150 kV/cm) to the capacitor demonstrated simultaneous electric-field-induced lattice distortion and crystallographic rotation in the BFO thin film. In response to the application of +15 V, the BFO lattice elongated by 0.08% along the [001]BFO direction and compressed by 0.05% along the [110]BFO direction. In addition, the BFO crystals were rotated by 0.01° along the [
1
¯
1
¯
0]STO direction as a result of electric-field-induced lattice distortion under epitaxial strain along the vertical direction at the step edges of the vicinal substrate. |
| doi_str_mv | 10.1063/1.5000495 |
| format | Article |
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1
¯
4 diffraction spots with and without the application of +15 V (150 kV/cm) to the capacitor demonstrated simultaneous electric-field-induced lattice distortion and crystallographic rotation in the BFO thin film. In response to the application of +15 V, the BFO lattice elongated by 0.08% along the [001]BFO direction and compressed by 0.05% along the [110]BFO direction. In addition, the BFO crystals were rotated by 0.01° along the [
1
¯
1
¯
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1
¯
4 diffraction spots with and without the application of +15 V (150 kV/cm) to the capacitor demonstrated simultaneous electric-field-induced lattice distortion and crystallographic rotation in the BFO thin film. In response to the application of +15 V, the BFO lattice elongated by 0.08% along the [001]BFO direction and compressed by 0.05% along the [110]BFO direction. In addition, the BFO crystals were rotated by 0.01° along the [
1
¯
1
¯
0]STO direction as a result of electric-field-induced lattice distortion under epitaxial strain along the vertical direction at the step edges of the vicinal substrate.</description><subject>Applied physics</subject><subject>Bismuth ferrite</subject><subject>Crystallography</subject><subject>Diffraction</subject><subject>Distortion</subject><subject>Electric fields</subject><subject>Epitaxy</subject><subject>Strontium titanates</subject><subject>Substrates</subject><subject>Synchrotron radiation</subject><subject>Thin films</subject><subject>Voltage pulses</subject><subject>X-ray diffraction</subject><issn>0003-6951</issn><issn>1077-3118</issn><fulltext>true</fulltext><rsrctype>article</rsrctype><creationdate>2017</creationdate><recordtype>article</recordtype><recordid>eNp9kE1LAzEQhoMoWD8O_oOAJ4XUfOxutkctrQqFXvS8ZJMJpmx31yRb2qP_3JQWPQiehnnnmXeYF6EbRseMFuKBjXNKaTbJT9CIUSmJYKw8RaMkClJMcnaOLkJYpTbnQozQ16wBHb3TxDpoDHGtGTQY3KgYnQZsXIidj65rsWsx9C6qrVMNfnJzWAocP5JqXbMOWAVsIIJfuzbt17s9H1wccHRrIB5C12zSYEu82iVba73Se98rdGZVE-D6WC_R-3z2Nn0hi-Xz6_RxQbSYiEhEralUhgOXugTJaW2zItNZXZdMFVAyWbBMMUttxkEobiTXpck5NbLIbS3FJbo9-Pa--xwgxGrVDb5NJyvOWEFLyrMsUXcHSvsuBA-26r1bK7-rGK32CVesOiac2PsDG3SKZf_LD7zp_C9Y9cb-B_91_gZ014ru</recordid><startdate>20170821</startdate><enddate>20170821</enddate><creator>Nakashima, Seiji</creator><creator>Sakata, Osami</creator><creator>Funakubo, Hiroshi</creator><creator>Shimizu, Takao</creator><creator>Ichinose, Daichi</creator><creator>Takayama, Kota</creator><creator>Imai, Yasuhiko</creator><creator>Fujisawa, Hironori</creator><creator>Shimizu, Masaru</creator><general>American Institute of Physics</general><scope>AAYXX</scope><scope>CITATION</scope><scope>8FD</scope><scope>H8D</scope><scope>L7M</scope></search><sort><creationdate>20170821</creationdate><title>Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction</title><author>Nakashima, Seiji ; Sakata, Osami ; Funakubo, Hiroshi ; Shimizu, Takao ; Ichinose, Daichi ; Takayama, Kota ; Imai, Yasuhiko ; Fujisawa, Hironori ; Shimizu, Masaru</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-c393t-3bc07ad2e27c8e720bf464c4bb81a6e817614a1f0f42e3a2d72c8d520d765fb73</frbrgroupid><rsrctype>articles</rsrctype><prefilter>articles</prefilter><language>eng</language><creationdate>2017</creationdate><topic>Applied physics</topic><topic>Bismuth ferrite</topic><topic>Crystallography</topic><topic>Diffraction</topic><topic>Distortion</topic><topic>Electric fields</topic><topic>Epitaxy</topic><topic>Strontium titanates</topic><topic>Substrates</topic><topic>Synchrotron radiation</topic><topic>Thin films</topic><topic>Voltage pulses</topic><topic>X-ray diffraction</topic><toplevel>peer_reviewed</toplevel><toplevel>online_resources</toplevel><creatorcontrib>Nakashima, Seiji</creatorcontrib><creatorcontrib>Sakata, Osami</creatorcontrib><creatorcontrib>Funakubo, Hiroshi</creatorcontrib><creatorcontrib>Shimizu, Takao</creatorcontrib><creatorcontrib>Ichinose, Daichi</creatorcontrib><creatorcontrib>Takayama, Kota</creatorcontrib><creatorcontrib>Imai, Yasuhiko</creatorcontrib><creatorcontrib>Fujisawa, Hironori</creatorcontrib><creatorcontrib>Shimizu, Masaru</creatorcontrib><collection>CrossRef</collection><collection>Technology Research Database</collection><collection>Aerospace Database</collection><collection>Advanced Technologies Database with Aerospace</collection><jtitle>Applied physics letters</jtitle></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext</fulltext></delivery><addata><au>Nakashima, Seiji</au><au>Sakata, Osami</au><au>Funakubo, Hiroshi</au><au>Shimizu, Takao</au><au>Ichinose, Daichi</au><au>Takayama, Kota</au><au>Imai, Yasuhiko</au><au>Fujisawa, Hironori</au><au>Shimizu, Masaru</au><format>journal</format><genre>article</genre><ristype>JOUR</ristype><atitle>Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction</atitle><jtitle>Applied physics letters</jtitle><date>2017-08-21</date><risdate>2017</risdate><volume>111</volume><issue>8</issue><issn>0003-6951</issn><eissn>1077-3118</eissn><coden>APPLAB</coden><abstract>Time-resolved X-ray diffraction (XRD) with synchrotron radiation while applying continuous voltage pulses was employed to investigate the electric-field-induced lattice distortion of an epitaxial BiFeO3 (BFO) thin film in a Pt/BFO (1 μm)/SrRuO3 (50 nm)/vicinal SrTiO3 (001) structure. XRD-reciprocal space maps based on the BFO 003, 114, and 1
1
¯
4 diffraction spots with and without the application of +15 V (150 kV/cm) to the capacitor demonstrated simultaneous electric-field-induced lattice distortion and crystallographic rotation in the BFO thin film. In response to the application of +15 V, the BFO lattice elongated by 0.08% along the [001]BFO direction and compressed by 0.05% along the [110]BFO direction. In addition, the BFO crystals were rotated by 0.01° along the [
1
¯
1
¯
0]STO direction as a result of electric-field-induced lattice distortion under epitaxial strain along the vertical direction at the step edges of the vicinal substrate.</abstract><cop>Melville</cop><pub>American Institute of Physics</pub><doi>10.1063/1.5000495</doi><tpages>5</tpages></addata></record> |
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| source | AIP Journals Complete; Alma/SFX Local Collection |
| subjects | Applied physics Bismuth ferrite Crystallography Diffraction Distortion Electric fields Epitaxy Strontium titanates Substrates Synchrotron radiation Thin films Voltage pulses X-ray diffraction |
| title | Electric-field-induced lattice distortion in epitaxial BiFeO3 thin films as determined by in situ time-resolved x-ray diffraction |
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