Development of a scanning time of flight microscope and its application to the study of charge transport in phase separated structured organic semiconductors

Development of a scanning time of flight microscope and its application to the study of charge transport in phase separated structured organic semiconductors

We describe a tool for studying the two-dimensional spatial variation in electronic properties of organic semiconductors: the scanning time-of-flight microscope (STOFm). The STOFm simultaneously measures the transmittance of polarized light and time-of-flight current transients with a pixel size

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Bibliographische Detailangaben
Veröffentlicht in:Journal of applied physics 2016-04, Vol.119 (14)
Hauptverfasser: Paul, Sanjoy, Ellman, Brett, Tripathi, Suvagata, Singh, Gautam, Twieg, Robert J.
Format: Artikel
Sprache:eng
Schlagworte:
Applied physics
CHARGE TRANSPORT
CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS
CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Correlation analysis
CORRELATIONS
Liquid crystals
LIQUIDS
MICROSCOPES
ORGANIC SEMICONDUCTORS
Photopolymerization
Polarized light
POLYMERS
Semiconductors
TIME-OF-FLIGHT METHOD
TWO-DIMENSIONAL CALCULATIONS
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Beschreibung
Zusammenfassung:We describe a tool for studying the two-dimensional spatial variation in electronic properties of organic semiconductors: the scanning time-of-flight microscope (STOFm). The STOFm simultaneously measures the transmittance of polarized light and time-of-flight current transients with a pixel size
ISSN:0021-8979
1089-7550
DOI:10.1063/1.4945429