Atom- and radical-surface sticking coefficients measured using resonance-enhanced multiphoton ionization
Sticking coefficients γ of neutral transient species at ambient temperature were measured using in situ resonance enhanced multiphoton ionization (REMPI) of the transients in a low pressure reactor at mTorr pressure. The value of γ for I on a stainless steel surface was 0.16, whereas γ for CF3 free...
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Veröffentlicht in: | The Journal of chemical physics 1989-10, Vol.91 (8), p.5037-5049 |
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Hauptverfasser: | , |
Format: | Artikel |
Sprache: | eng |
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Zusammenfassung: | Sticking coefficients γ of neutral transient species at ambient temperature were measured using in situ resonance enhanced multiphoton ionization (REMPI) of the transients in a low pressure reactor at mTorr pressure. The value of γ for I on a stainless steel surface was 0.16, whereas γ for CF3 free radical on the same surface was 0.5 was found for highly vibrationally excited CF3 containing 5900 cm−1 of internal energy and for SiH2 containing 7000 cm−1 of internal energy. The surface was stainless steel in the former case and a carbon-containing Si and H surface in the latter case. |
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ISSN: | 0021-9606 1089-7690 |
DOI: | 10.1063/1.457620 |