Atom- and radical-surface sticking coefficients measured using resonance-enhanced multiphoton ionization

Sticking coefficients γ of neutral transient species at ambient temperature were measured using in situ resonance enhanced multiphoton ionization (REMPI) of the transients in a low pressure reactor at mTorr pressure. The value of γ for I on a stainless steel surface was 0.16, whereas γ for CF3 free...

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Veröffentlicht in:The Journal of chemical physics 1989-10, Vol.91 (8), p.5037-5049
Hauptverfasser: ROBERTSON, R. M, ROSSI, M. J
Format: Artikel
Sprache:eng
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Zusammenfassung:Sticking coefficients γ of neutral transient species at ambient temperature were measured using in situ resonance enhanced multiphoton ionization (REMPI) of the transients in a low pressure reactor at mTorr pressure. The value of γ for I on a stainless steel surface was 0.16, whereas γ for CF3 free radical on the same surface was 0.5 was found for highly vibrationally excited CF3 containing 5900 cm−1 of internal energy and for SiH2 containing 7000 cm−1 of internal energy. The surface was stainless steel in the former case and a carbon-containing Si and H surface in the latter case.
ISSN:0021-9606
1089-7690
DOI:10.1063/1.457620