A threshold photoelectron–photoion coincidence study of the N2O+ dissociation between 15 and 20.5 eV

Branching ratios and the kinetic energy released in the various fragmentation channels of energy selected N2O+ (15–20.5 eV) were investigated by the technique of threshold photoelectron–photoion coincidence. Pulsed synchrotron radiation from ACO, Orsay’s storage ring, dispersed by a monochromator, w...

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Veröffentlicht in:The Journal of chemical physics 1980-06, Vol.72 (12), p.6587-6592
Hauptverfasser: Nenner, Irene, Guyon, Paul-Marie, Baer, Tomas, Govers, Thomas R.
Format: Artikel
Sprache:eng
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Zusammenfassung:Branching ratios and the kinetic energy released in the various fragmentation channels of energy selected N2O+ (15–20.5 eV) were investigated by the technique of threshold photoelectron–photoion coincidence. Pulsed synchrotron radiation from ACO, Orsay’s storage ring, dispersed by a monochromator, was used as a photon source. Threshold electrons were energy selected on the basis of angular and temporal discrimination against energetic electrons. The energy region below 16.388 eV and the ? state were investigated in detail. Below the ? state the most abundant fragment ion is O+, while above the ? state NO+ dominates. Results for the ? and ? states are also reported.
ISSN:0021-9606
1089-7690
DOI:10.1063/1.439115