A threshold photoelectron–photoion coincidence study of the N2O+ dissociation between 15 and 20.5 eV
Branching ratios and the kinetic energy released in the various fragmentation channels of energy selected N2O+ (15–20.5 eV) were investigated by the technique of threshold photoelectron–photoion coincidence. Pulsed synchrotron radiation from ACO, Orsay’s storage ring, dispersed by a monochromator, w...
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Veröffentlicht in: | The Journal of chemical physics 1980-06, Vol.72 (12), p.6587-6592 |
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Hauptverfasser: | , , , |
Format: | Artikel |
Sprache: | eng |
Online-Zugang: | Volltext |
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Zusammenfassung: | Branching ratios and the kinetic energy released in the various fragmentation channels of energy selected N2O+ (15–20.5 eV) were investigated by the technique of threshold photoelectron–photoion coincidence. Pulsed synchrotron radiation from ACO, Orsay’s storage ring, dispersed by a monochromator, was used as a photon source. Threshold electrons were energy selected on the basis of angular and temporal discrimination against energetic electrons. The energy region below 16.388 eV and the ? state were investigated in detail. Below the ? state the most abundant fragment ion is O+, while above the ? state NO+ dominates. Results for the ? and ? states are also reported. |
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ISSN: | 0021-9606 1089-7690 |
DOI: | 10.1063/1.439115 |