Transmission electron microscopy structure and platinum-like temperature coefficient of resistance in a ruthenate-based thick film resistor with copper oxide

As an alternative to thin-film platinum temperature sensor elements, thick film resistor ones are of interest for circuits which can withstand a near-engine environment. From a pyrochlore paste (DuPont 5091D), a close match is obtained (after firing) to the positive temperature coefficient of resist...

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Veröffentlicht in:Journal of applied physics 2000-07, Vol.88 (2), p.1124-1128
Hauptverfasser: Jiang, J. C., Crosbie, Gary M., Tian, W., Cameron, K. K., Pan, X. Q.
Format: Artikel
Sprache:eng
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Zusammenfassung:As an alternative to thin-film platinum temperature sensor elements, thick film resistor ones are of interest for circuits which can withstand a near-engine environment. From a pyrochlore paste (DuPont 5091D), a close match is obtained (after firing) to the positive temperature coefficient of resistance (TCR) of Pt. Within the glassy matrix during 850 °C firing, needle-like RuO2 grains grow by a mechanism consistent with periodic bond chain theory. The acicular growth habit is attributed to a Cu2O additive, which is assumed to oxidize upon firing. The needles provide direct paths for metallic conduction and a characteristic positive TCR to the thick film in spite of having a low RuO2 volume fraction.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.373786