A comparative study on the electrical conduction mechanisms of (Ba0.5Sr0.5)TiO3 thin films on Pt and IrO2 electrodes

Electrical conduction mechanisms for Pt/(Ba0.5Sr0.5)TiO3 (BST)/Pt, IrO2/BST/IrO2, and Pt/BST/IrO2 capacitors were studied. The Pt/BST/Pt capacitor shows a Schottky emission behavior with interface potential barrier heights of about 1.5–1.6 eV. The barrier height is largely determined by the surface...

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Veröffentlicht in:Journal of applied physics 1998-04, Vol.83 (7), p.3703-3713
Hauptverfasser: Hwang, Cheol Seong, Lee, Byoung Taek, Kang, Chang Seok, Kim, Jin Won, Lee, Ki Hoon, Cho, Hag-Ju, Horii, Hideki, Kim, Wan Don, Lee, Sang In, Roh, Young Bum, Lee, Moon Yong
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Sprache:eng
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Zusammenfassung:Electrical conduction mechanisms for Pt/(Ba0.5Sr0.5)TiO3 (BST)/Pt, IrO2/BST/IrO2, and Pt/BST/IrO2 capacitors were studied. The Pt/BST/Pt capacitor shows a Schottky emission behavior with interface potential barrier heights of about 1.5–1.6 eV. The barrier height is largely determined by the surface electron trap states of the BST. The IrO2/BST interface shows an ohmic contact nature due to the elimination of the surface trap states as the result of the formation of strong chemical bonds between the IrO2 and BST which results in the Poole–Frenkel emission conduction mechanism. Pt/BST/IrO2 capacitor shows Schottky emission behavior and a positive temperature coefficient of resistivity (PTCR) effect depending on the bias polarity. The electron trap states at the Pt/BST interface and the positive space charges within the carrier depletion layer result in the PTCR effect.
ISSN:0021-8979
1089-7550
DOI:10.1063/1.366595