Edge effects in photorefractive thin films

We have used a two-dimensional charge transport model to study edge effects in photorefractive thin films. Our result shows the presence of a large surface charge layer that causes saturation of trap-limited-field in the large fringe spacing limit. Quadratic electro-optic materials were used as an example to quantitatively study the contribution of the surface-charge-layer field to the total photorefractive grating. We clearly demonstrate that the device performance can be dominated by either surface charge or bulk trap charges.