Electrical characteristics of wrinkle-free graphene formed by laser graphitization of 4H-SiC

Wrinkle free few layer graphene was demonstrated by a graphitization of 4H-SiC substrates using a high power pulsed KrF laser. Wrinkles often observed after thermal graphitization were eliminated with a short heat cycle using a pulse laser anneal. Few layer graphene formed by the laser graphitizatio...

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Veröffentlicht in:Applied physics letters 2011-08, Vol.99 (8), p.082111-082111-3
Hauptverfasser: Hwang, Hyeon Jun, Cho, Chunhum, Lim, Sung Kwan, Lee, Seung Yong, Kang, Chang Goo, Hwang, Hyunsang, Lee, Byoung Hun
Format: Artikel
Sprache:eng
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Zusammenfassung:Wrinkle free few layer graphene was demonstrated by a graphitization of 4H-SiC substrates using a high power pulsed KrF laser. Wrinkles often observed after thermal graphitization were eliminated with a short heat cycle using a pulse laser anneal. Few layer graphene formed by the laser graphitization appears to have a non-Bernal stack, which leads to on-off ratio of ∼2 even at a few layer graphene. Drive current of 143 μ A/ μ m was obtained at V d =100 mV and field effect mobility was 374 cm 2 /Vs.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3629785