Characterization of a junctionless diode

A diode has been realised using a silicon junctionless (JL) transistor. The device contains neither PN junction nor Schottky junction. The device is measured at different temperatures. The characteristics of the JL diode are essentially identical to those of a regular PN junction diode. The JL diode...

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Veröffentlicht in:Applied physics letters 2011-07, Vol.99 (1), p.013502-013502-3
Hauptverfasser: Yu, Ran, Ferain, Isabelle, Akhavan, Nima Dehdashti, Razavi, Pedram, Duffy, Ray, Colinge, Jean-Pierre
Format: Artikel
Sprache:eng
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Zusammenfassung:A diode has been realised using a silicon junctionless (JL) transistor. The device contains neither PN junction nor Schottky junction. The device is measured at different temperatures. The characteristics of the JL diode are essentially identical to those of a regular PN junction diode. The JL diode has an on/off current ratio of 10 8 , an ideality factor of 1.09, and a reverse leakage current of 1×10 −14 A at room temperature. The mechanism of the leakage current is discussed using the activation energy ( E A ). The turn-on voltage of the device can be tuned by JL transistor threshold voltage.
ISSN:0003-6951
1077-3118
DOI:10.1063/1.3608150