Observation of degradation processes of Al electrodes in organic electroluminescence devices by electroluminescence microscopy, atomic force microscopy, scanning electron microscopy, and Auger electron spectroscopy

Degradation of top electrodes is one of the most important factors to determine the lifetimes of organic electroluminescence (EL) devices. An organic EL device [indium thin oxide (ITO)/N,N′-diphenyl-N,N′-bis(3-methylphenyl)-(1,1′-biphenyl)-4, 4′-diamine (TPD)/tris(8-hydroxy- quinoline)aluminum (Alq3...

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Veröffentlicht in:	Journal of applied physics 1994-11, Vol.76 (9), p.5118-5121
Hauptverfasser:	Do, L. M., Han, E. M., Niidome, Y., Fujihira, M., Kanno, T., Yoshida, S., Maeda, A., Ikushima, A. J.
Format:	Artikel
Sprache:	eng
Online-Zugang:	Volltext
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